Dynamic Test & SoC Authority
Slider-Scale
Vertical Arrays.
The industry standard for Pitch under 80μm. Supporting high-frequency dynamic testing for HDD heads and advanced SoC packaging with zero-scrub vertical integrity.
Core Architecture
The Physics of
Zero-Scrub Contact.
Engineered for 5nm/3nm Advanced Nodes. Our vertical solutions protect delicate Micro-Bumps and Cu-Pillars by eliminating lateral scrubbing movement during contact. Derived from 30 years of HDD contact mechanics, we deliver the stability required for mass-volume SoC characterization.
Ideal for: WLCSP, HBM, and Automotive Power Nodes.
Storage Pedigree
Mastering
SDT & QST.
For three decades, our engineering core has defined the standards for Slider Dynamic Test (SDT). We apply this high-RPM simulation expertise to our vertical probe cards, ensuring zero signal drift even under the most aggressive high-frequency test cycles.
