The Mechanical DNA of Interconnects

From Slider
To Silicon.

Merging 30 years of HDD-standard contact mechanics with semiconductor-scale precision. Engineered for zero-drift reliability.

Since 2003
CORPORATE FOUNDATION
20μm Pitch
FABRICATION MASTERY
R² = 1.0
VALIDATION STANDARD

Primary Business

Advanced Probe Card Fabrication

Specializing in high-density Cantilever and Vertical architectures. Our team leverages 30 years of HDD dynamic testing expertise to support  20μm staggered pitch and up to 6,000+ PIN counts. We utilize verified N7 Alloy, WRe, and Pd Alloy metallurgy for unrivaled contact stability.

Detailed macro view of high-precision probe card fabrication by Galaxy Tech, showcasing 20um narrow-pitch probe arrays and structural reinforcement for logic and memory semiconductor testing.

Yield Engineering

Active Parameter Write-Back

We close the loop between hardware and silicon yield. Using Agilent-based system insights, we achieve a verified R² = 1.0 accuracy across all high-density channels. Our proprietary calibration service writes coefficients directly into the Flip-Chip post-assembly.

LINEARITY: VERIFIED_ZERO_DRIFT

Galaxy Tech digital metrology log demonstrating perfect R²=1 linearity in Voltage-Measure-Sync calibration for high-density Flip-Chip interconnects. This verified mathematical model ensures zero signal drift and optimized yield for advanced semiconductor wafer testing interfaces."

Agile In-House Mastery.

Beyond simulations, we maintain a dedicated technical hub for high-fidelity technical batches. All lamination, precision soldering, and validation are performed within our agile workshop to ensure 100% process sovereignty.

  • ✔ 30+ Yrs Engineering Mastery
  • ✔ Agilent-Verified Calibration
  • ✔ In-House Lamination Control
Senior engineer performing Agilent-verified calibration and signal integrity testing at Galaxy Tech's technical hub.

Execute Your Mission-Critical Interconnect.

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