Exacting IC Pin Test Interfaces

20μm Precision.
Zero Drift.

Engineered for high-pin count DDI and Logic characterization. We merge 30 years of HDD contact heritage with 2.5Gbps high-frequency signal integrity.

20μm PitchMinimum Staggered Resolution
6,000+ PINSMulti-Site Test Capacity
WRe 750 HvAdvanced Metallurgy

Display Driver Domain

Exacting LCD/OLED
Test Interfaces.

Derived from 30 years of serving the world’s most sensitive HDD supply chains. Galaxy’s cantilever solutions are specifically tuned for high-RPM simulation environments and ultra-fine pad sorting.

FrequencyUp to 2.5 Gbps
Alignment± 3.0μm Precision
Leakage< 1pA @ 10V (WAT Grade)


Galaxy Cantilever Probing

Process Sovereignty

Verified
First-Pass Yield.

Execution is verified by data. Utilizing high-resolution X-Ray metrology and active calibration, we provide the verified logs that prove our manufactured output perfectly matches your design parameters.

Result: 100% Batch Validation

Agilent System pre-calibration integrated.


Galaxy Yield Verification

Optimize Your
Wafer Sorting Lifecycle.

SUBMIT TECHNICAL RFQ